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Description

This dataset contains Level 2A (L2A) surface reflectance images from the Airborne Visible / Infrared Imaging Spectrometer-3 (AVIRIS-3) instrument. This is the NASA Earth Observing System Data and Information System (EOSDIS) facility instrument archive of these data. The NASA AVIRIS-3 is a spectral mapping system that measures reflected radiance at 7.4-nm intervals in the Visible to Shortwave Infrared (VSWIR) spectral range from 390-2500 nm. Surface hemispherical directional reflectance was derived from calibrated radiance using an optimal estimation algorithm. For each flight line, two file types are included: orthocorrected surface reflectance (RFL_ORT) and orthocorrected reflectance uncertainty (UNC_ORT) in netCDF format. Both file types include data projected in a UTM coordinate system. In addition, ancillary files for each flight line are provided, including a quick look image in GeoTIFF format and text files in YAML format that document processing algorithms and parameters used during production.

Product Summary

Platforms
B-200
Instruments
AVIRIS-3
Spatial Extent
N: 72.6 S: 16.5 E: -66.18 W: -178.68
Geographic Region
CANADA,
UNITED STATES OF AMERICA
Coordinate System
CARTESIAN
Granule Spatial Representation
GEODETIC
Temporal Extent
2023-07-05 to 2025-01-23
Data Partner
THE OAK RIDGE NATIONAL LABORATORY (ORNL) DISTRIBUTED ACTIVE ARCHIVE CENTER (DAAC) (ORNL_DAAC)
Concept ID
c3369603199-ornl_cloud
Data State
ACTIVE
Processing Level
2
Published
Updated

Citation

Citation is critically important for dataset documentation and discovery. This dataset is openly shared, without restriction, in accordance with the EOSDIS Data Use and Citation Guidance.

Copy Citation

Brodrick, P. G., Chlus, A. M., Bohn, U. N., Greenberg, E., Montgomery, J., Chapman, J. W., Eastwood, M., Lundeen, S. R., Eckert, R., Olson-Duvall, W., Thompson, D. R., & Green, R. O. (2025). AVIRIS-3 L2A Orthocorrected Surface Reflectance, Facility Instrument Collection (Version 1). ORNL Distributed Active Archive Center. https://doi.org/10.3334/ORNLDAAC/2357 Date Accessed: 2025-06-24

Additional Citation

Brodrick, P.G., A.M. Chlus, U.N. Bohn, E. Greenberg, J. Montgomery, J.W. Chapman, M. Eastwood, S.R. Lundeen, R. Eckert, W. Olson-Duvall, D.R. Thompson, and R.O. Green. 2025. AVIRIS-3 L2A Orthocorrected Surface Reflectance, Facility Instrument Collection. ORNL DAAC, Oak Ridge, Tennessee, USA. https://doi.org/10.3334/ORNLDAAC/2357

Documents

GENERAL DOCUMENTATION AVIRIS-3 L2A Orthocorrected Surface Reflectance, Facility Instrument Collection: AV3_L2A_RFL.pdf
USER'S GUIDE ORNL DAAC Data Set Documentation

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