Description
The leaf spectra datasets contain visible and near infrared reflectance spectra data for both fresh and dry leaf samples collected in the ACCP. These samples are from Blackhawk Island, WI, Harvard Forest, MA, Howland, ME, Jasper Ridge, CA field sites and the Douglas fir and bigleaf maple seedling canopy study sites. Data reported for each sample is absorbance [log(1/Reflectance)] from 400-2498nm at 2nm intervals and a resolution of 10nm. These data were collected for the purpose of determining the relationship of foliar chemical concentrations with visible and near infrared wavelength reflectance spectra.. Both multiple linear regression and partial least square regression techniques have been used to relate lab chemistry data to spectral reflectance. ORNL DAAC maintains information on the entire ACCP.
Product Summary
Citation
Citation is critically important for dataset documentation and discovery. This dataset is openly shared, without restriction, in accordance with the EOSDIS Data Use and Citation Guidance.
Copy Citation
Additional Citation
Documents
GENERAL DOCUMENTATION | Data Set Documentation | |
USER'S GUIDE | ORNL DAAC Data Set Documentation |